Giacomo, Giulio Di
Reliability of electronic packages and semiconductor devices - New York, N.Y. : McGraw-Hill, 1997 - 410
SEMICONDUCTORS--RELIABILITY
MICROELECTRONIC PACKAGING--RELIABILITY
TK7871.85 / D534R
Reliability of electronic packages and semiconductor devices - New York, N.Y. : McGraw-Hill, 1997 - 410
SEMICONDUCTORS--RELIABILITY
MICROELECTRONIC PACKAGING--RELIABILITY
TK7871.85 / D534R