Kapur, Rohit.
CTL for test information of digital ICs / [electronic resource] by Rohit Kapur. - New York, N.Y. : Kluwer Academic Publishers, c2003. - 1 online resource.
9781402072932 9780306478260 (electronic bk.)
Digital integrated circuits--Testing--Standards.
Computer hardware description languages.
TK7874.65 / .K35 2003
CTL for test information of digital ICs / [electronic resource] by Rohit Kapur. - New York, N.Y. : Kluwer Academic Publishers, c2003. - 1 online resource.
9781402072932 9780306478260 (electronic bk.)
Digital integrated circuits--Testing--Standards.
Computer hardware description languages.
TK7874.65 / .K35 2003