Semiconductor measurements and instrumentation
By: Runyan, W.R.
Contributor(s): Shaffner, T.J.
Material type:
BookPublisher: New York, N.Y. : McGraw-Hill, 1998Edition: 2nd ed.Description: 454 p.Call No.:
QC611.24
R869S 1998
Subject(s): SEMICONDUCTORS | PHYSICAL MEASUREMENTS
| Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|
| Main Campus Book Shelves | QC611.24 R869S 1998 (Browse shelf) | Available | 215792 |
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| QC611 N425S 2003 Semiconductor physics and devices : basic principles / | QC611 W447Q Quantum semiconductor structures : fundamentals and applications | QC611 Y8F 1999 Fundamentals of semiconductors : physics and materials properties | QC611.24 R869S 1998 Semiconductor measurements and instrumentation | QC611.26 ม152ฟ 2535 ฟิสิกส์ของสารกึ่งตัวนำ | QC611.26 ม152ฟ 2535 ฟิสิกส์ของสารกึ่งตัวนำ | QC611.92 O742F Foundations of applied superconductivity |
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