Inside the TOEIC exam / by Donald Van Metre and the staff of Kaplan Test Prep and Admissions
By: Van Metre, Donald.
Contributor(s): Kaplan Test Prep and Admissions.
Material type:
BookPublisher: New York, N.Y. : Kaplan, 2008Edition: 2nd ed.Description: 227 p. : ill.ISBN: 9781427797810.Call No.:
PE1128
V365I 2008
Other title: Inside the TOEIC exam : your step-by-step guide to scoring higher.Subject(s): Test of English for international communication -- Study guides | English language -- Textbooks for foreign speakers | English language -- Examinations -- Study guidesGeneral Note: Cover title: Inside the TOEIC exam : your step-by-step guide to scoring higher
| Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|
| Main Campus Book Shelves | PE1128 V365I 2008 (Browse shelf) | Available | 201008300007 |
Cover title: Inside the TOEIC exam : your step-by-step guide to scoring higher
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