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Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].

Contributor(s): Strong, Alvin Wayne, 1949-.
Material type: materialTypeLabelBookSeries: Publisher: Hoboken, N.J. : IEEE Press, c2009Description: 624 p. : ill.ISBN: 9780471731726.Call No.: TK7871.99.M44 R444 Subject(s): Metal oxide semiconductors, Complementary -- ReliabilityBibliography, etc. Note: Includes bibliographical references and index
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Book Shelves 		TK7871.99.M44 R444 (Browse shelf) Available 201106140023

Includes bibliographical references and index

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