Applied logistic regression [electronic resource] / David W. Hosmer, Stanley Lemeshow.
By: Hosmer, David W.
Contributor(s): Lemeshow, Stanley.
Material type:
BookSeries: Wiley series in probability and statisticsTexts and references section.Publisher: New York, N.Y. : Wiley-Interscience, c2000Edition: 2nd ed.Description: xii, 373 p. : ill. ; 25 cm.ISBN: 9780471356325; 9780471654025 (electronic bk.).Call No.:
QA278.2
.H67 2000
Subject(s): Regression analysisOnline resources: Electronic Resources General Note: "A Wiley-Interscience publication."Bibliography, etc. Note: Includes bibliographical references and index.
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"A Wiley-Interscience publication."
Includes bibliographical references and index.
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