TY  - BOOK
AU  - Runyan,W.R.
AU  - Shaffner,T.J.
TI  - Semiconductor measurements and instrumentation
AV  - QC611.24 R869S 1998
PY  - 1998///
CY  - New York, N.Y.
PB  - McGraw-Hill
KW  - SEMICONDUCTORS
KW  - PHYSICAL MEASUREMENTS
ER  -