Tsui, Frank F. <br/><br/>
LSI/VLSI testability design 

 - New York, N.Y. :  McGraw-Hill,  1988 
 - 702 
<br/><br/><label>Subjects--Topical Terms: </label><br/>INTEGRATED CIRCUITS--LARGE SCALE INTEGRATION--TESTING<br/>INTEGRATED CIRCUITS--VERY LARGE SCALE INTEGRATION--TESTING
<br/><br/><label>LC Class. No.: </label>TK7874  / T784L