TY  - BOOK
AU  - Tsui,Frank F.
TI  - LSI/VLSI testability design
AV  - TK7874 T784L
PY  - 1988///
CY  - New York, N.Y.
PB  - McGraw-Hill
KW  - INTEGRATED CIRCUITS
KW  - LARGE SCALE INTEGRATION
KW  - TESTING
KW  - VERY LARGE SCALE INTEGRATION
ER  -