Giacomo, Giulio Di <br/><br/>
Reliability of electronic packages and semiconductor devices 

 - New York, N.Y. :  McGraw-Hill,  1997 
 - 410 
<br/><br/><label>Subjects--Topical Terms: </label><br/>SEMICONDUCTORS--RELIABILITY<br/>MICROELECTRONIC PACKAGING--RELIABILITY
<br/><br/><label>LC Class. No.: </label>TK7871.85  / D534R