TY  - BOOK
AU  - Giacomo,Giulio Di
TI  - Reliability of electronic packages and semiconductor devices
AV  - TK7871.85 D534R
PY  - 1997///
CY  - New York, N.Y.
PB  - McGraw-Hill
KW  - SEMICONDUCTORS
KW  - RELIABILITY
KW  - MICROELECTRONIC PACKAGING
ER  -