Van Metre, Donald <br/><br/>
Inside the TOEIC exam / 
 Inside the TOEIC exam :  your step-by-step guide to scoring higher 
by Donald Van Metre and the staff of Kaplan Test Prep and Admissions 
 - 2nd ed. 
 - New York, N.Y. :  Kaplan,  2008 
 - 227 p. :  ill. 
<br/><br/> Cover title: Inside the TOEIC exam : your step-by-step guide to scoring higher 
<br/><br/><label>ISBN: </label>9781427797810 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Test of English for international communication--Study guides<br/>English language--Textbooks for foreign speakers<br/>English language--Examinations--Study guides
<br/><br/><label>LC Class. No.: </label>PE1128  / V365I 2008