Reliability wearout mechanisms in advanced CMOS technologies / 
Alvin W. Strong ... [et al.]. 
 - Hoboken, N.J. :  IEEE Press,  c2009. 
 - 624 p. :  ill. 
 - IEEE Press series on microelectronic systems / Stewart K. Tewksbury and Joe E. Brewer, series editors .
<br/><br/>Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>9780471731726 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary--Reliability
<br/><br/><label>LC Class. No.: </label>TK7871.99.M44  / R444