TY  - BOOK
AU  - Strong,Alvin Wayne
TI  - Reliability wearout mechanisms in advanced CMOS technologies
T2  - IEEE Press series on microelectronic systems / Stewart K. Tewksbury and Joe E. Brewer, series editors
SN  - 9780471731726
AV  - TK7871.99.M44 R444
PY  - 2009///
CY  - Hoboken, N.J.
PB  - IEEE Press
KW  - Metal oxide semiconductors, Complementary
KW  - Reliability
N1  - Includes bibliographical references and index
ER  -