Hosmer, David W. <br/><br/>
Applied logistic regression  [electronic resource] / 
David W. Hosmer, Jr., Stanley Lemeshow. 
 - New York :  Wiley,  c1989. 
 - 1 online resource. 
 - Wiley series in probability and mathematical statistics .
<br/><br/> "A Wiley-Interscience publication." 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780471615538 9780585362694 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Regression analysis.
<br/><br/><label>LC Class. No.: </label>QA278.2  / .H67 1989