Hosmer, David W. <br/><br/>
Applied logistic regression  [electronic resource] / 
David W. Hosmer, Stanley Lemeshow. 
 - 2nd ed. 
 - New York, N.Y. :  Wiley-Interscience,  c2000. 
 - xii, 373 p. :  ill. ;  25 cm. 
 - Wiley series in probability and statistics. .
<br/><br/> "A Wiley-Interscience publication." 
<br/><br/>Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9780471356325 9780471654025 (electronic bk.) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Regression analysis.
<br/><br/><label>LC Class. No.: </label>QA278.2  / .H67 2000