TY  - BOOK
AU  - Kapur,Rohit
TI  - CTL for test information of digital ICs
SN  - 9781402072932
AV  - TK7874.65 .K35 2003
PY  - 2003///
CY  - New York, N.Y.
PB  - Kluwer Academic Publishers
KW  - Digital integrated circuits
KW  - Testing
KW  - Standards
KW  - Computer hardware description languages
UR  - http://search.ebscohost.com/login.aspx?direct=true&db=nlebk&AN=99315&site=ehost-live&scope=site
ER  -