| 000 | 00636nam0a22002410a04500 | ||
|---|---|---|---|
| 999 |
_c145507 _d145507 |
||
| 001 | 000044438 | ||
| 003 | TH-BaBU | ||
| 005 | 20200211114449.0 | ||
| 008 | s1998 xxu 0000 000 0 eng d | ||
| 035 | _a2001044978 | ||
| 040 |
_aTH-BaBU _cTH-BaBU |
||
| 050 | 4 |
_aQC611.24 _bR869S 1998 |
|
| 100 | 1 | _aRunyan, W.R. | |
| 245 | 1 | 0 | _aSemiconductor measurements and instrumentation |
| 250 | _a2nd ed. | ||
| 260 |
_aNew York, N.Y. : _bMcGraw-Hill, _c1998 |
||
| 300 | _a454 p. | ||
| 650 | 4 | _aSEMICONDUCTORS | |
| 650 | 4 | _aPHYSICAL MEASUREMENTS | |
| 700 | 1 | _aShaffner, T.J. | |
| 942 |
_2lcc _cBK |
||
| 990 |
_aA47077 _bJan 4 2005 3:10PM |
||