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| 003 | TH-BaBU | ||
| 005 | 20211007161819.0 | ||
| 008 | 020917s2003 nyua 000 0 eng d | ||
| 020 | _a9781402072932 | ||
| 020 | _a9780306478260 (electronic bk.) | ||
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_aDLC _cTH-BaBU |
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_aTK7874.65 _b.K35 2003 |
| 100 | 1 | _aKapur, Rohit. | |
| 245 | 1 | 0 |
_aCTL for test information of digital ICs / _h[electronic resource] _cby Rohit Kapur. |
| 260 |
_aNew York, N.Y. : _bKluwer Academic Publishers, _cc2003. |
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| 300 | _a1 online resource. | ||
| 650 | 0 |
_aDigital integrated circuits _xTesting _xStandards. |
|
| 650 | 0 | _aComputer hardware description languages. | |
| 856 | 4 | 1 |
_uhttp://search.ebscohost.com/login.aspx?direct=true&db=nlebk&AN=99315&site=ehost-live&scope=site _zElectronic Resources |
| 942 |
_2lcc _cEB |
||