Tsui, Frank F.
LSI/VLSI testability design - New York, N.Y. : McGraw-Hill, 1988 - 702
INTEGRATED CIRCUITS--LARGE SCALE INTEGRATION--TESTING
INTEGRATED CIRCUITS--VERY LARGE SCALE INTEGRATION--TESTING
TK7874 / T784L
LSI/VLSI testability design - New York, N.Y. : McGraw-Hill, 1988 - 702
INTEGRATED CIRCUITS--LARGE SCALE INTEGRATION--TESTING
INTEGRATED CIRCUITS--VERY LARGE SCALE INTEGRATION--TESTING
TK7874 / T784L