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LSI/VLSI testability design

By: Tsui, Frank F.
Material type: materialTypeLabelBookPublisher: New York, N.Y. : McGraw-Hill, 1988Description: 702.Call No.: TK7874 T784L Subject(s): INTEGRATED CIRCUITS -- LARGE SCALE INTEGRATION -- TESTING | INTEGRATED CIRCUITS -- VERY LARGE SCALE INTEGRATION -- TESTING
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Main Campus
Book Shelves 		TK7874 T784L (Browse shelf) Available 112628

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