Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].
Contributor(s): Strong, Alvin Wayne.
Material type:
BookSeries: Publisher: Hoboken, N.J. : IEEE Press, c2009Description: 624 p. : ill.ISBN: 9780471731726.Call No.:
TK7871.99.M44
R444
Subject(s): Metal oxide semiconductors, Complementary -- ReliabilityBibliography, etc. Note: Includes bibliographical references and index
| Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|
| Main Campus Book Shelves | TK7871.99.M44 R444 (Browse shelf) | Available | 201106140023 |
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| TK7871.99 .M44 M377M Modern CMOS circuits manual | TK7871.99 .M44 M377M Modern CMOS circuits manual | TK7871.99.M44 N366 Nanoscale CMOS : | TK7871.99.M44 R444 Reliability wearout mechanisms in advanced CMOS technologies / | TK7871.99 .T5 B472T 1997 Thyristor engineering / | TK7871.99 .T5 M67M Motorola Thyristor device data | TK7871.99 .T5 M67M Motorola Thyristor device data |
Includes bibliographical references and index
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