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CTL for test information of digital ICs / [electronic resource] by Rohit Kapur.

By: Kapur, Rohit.
Material type: materialTypeLabelBookPublisher: New York, N.Y. : Kluwer Academic Publishers, c2003Description: 1 online resource.ISBN: 9781402072932; 9780306478260 (electronic bk.).Call No.: TK7874.65 .K35 2003 Subject(s): Digital integrated circuits -- Testing -- Standards | Computer hardware description languagesOnline resources: Electronic Resources
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