LSI/VLSI testability design
By: Tsui, Frank F.
Material type: BookPublisher: New York, N.Y. : McGraw-Hill, 1988Description: 702.Call No.: TK7874 T784L Subject(s): INTEGRATED CIRCUITS -- LARGE SCALE INTEGRATION -- TESTING | INTEGRATED CIRCUITS -- VERY LARGE SCALE INTEGRATION -- TESTINGCurrent location | Call number | Status | Date due | Barcode |
---|---|---|---|---|
Main Campus Book Shelves | TK7874 T784L (Browse shelf) | Available | 112628 |
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TK7874 S536I Integrated circuit design, fabrication and test | TK7874 S536I Integrated circuit design, fabrication and test | TK7874 S63I Introduction to VLSI process engineering | TK7874 T784L LSI/VLSI testability design | TK7874 T784L LSI/VLSI testability design | TK7874 U935F Fundamentals of MOS digital integrated circuits | TK7874 U935F Fundamentals of MOS digital integrated circuits |
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